Enodo Analytics Cube

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Get hands-on with advanced materials characterisation by exploring surface structures using optical and electron microscopy, identifying chemical compositions with FTIR, and measuring surface roughness and topography through profilometry, all in a compact, student-friendly format.

 This tool introduces students to advanced materials characterisation techniques through hands-on exploration. Students will use Scanning Electron Microscopy (SEM) to capture high-resolution images of insulating samples, apply Fourier Transform Infrared (FTIR) spectroscopy to identify unknown materials based on their molecular absorption signatures, and employ a profilometer to measure the surface profile of engraved structures.

Designed for students aged 16–18 and university students, the Analytical Cube offers an accessible yet robust way to investigate materials at the micro and nano scale. By engaging in guided but open-ended experiments, learners develop a deeper understanding of analytical methods while enhancing their scientific reasoning and data interpretation skills. This approach supports curiosity-driven learning and real-world application in STEM education.

 Advanced characterisation techniques are essential tools in modern science and engineering, allowing us to uncover the structure, composition, and properties of materials at micro and nano scales. These methods, such as SEM, FTIR, and profilometry, are widely used in industries like electronics, aerospace, biomedical engineering, and materials science to guide design and innovation. However, they are often perceived as complex and out of reach for students.
This experiment makes advanced characterisation accessible through simple, structured activities that introduce powerful analytical tools in a hands-on, student-friendly format. Learners can visualize microstructures, identify chemical compounds, and measure surface topography—deepening their understanding of how materials behave and why those properties matter.
From identifying contaminants in pharmaceuticals to inspecting semiconductor surfaces or analyzing the texture of 3D-printed components, these techniques are foundational in real-world problem-solving and innovation. This experience helps students build confidence, curiosity, and critical thinking skills for careers in science, engineering, and beyond. 

1. Scanning Electron Microscopy Analysis:

Mount the given sample to SEM stub using carbon adhesive tape. Place the sample in the sputter coating chamber, making sure it is properly secured and positioned for coating.

Evacuate the chamber to remove any residual gases and create a clean environment for coating.

Choose the appropriate sputter coating material (gold) based on the desired coating properties and sample requirements.

Start the sputter coating process to the target material. This causes atoms or ions of the target material to be ejected and deposited onto the sample surface, forming a thin coating.

Monitor the coating process to ensure uniformity and desired thickness of the coating layer.

Once the coating process is complete, allow the chamber to cool down and then vent it to atmospheric pressure before removing the coated sample. Carefully remove the coated sample from the chamber for further analysis.

Secure the sample onto a sample holder suitable for SEM analysis. Ensure proper orientation and stability of the sample.

Place the sample holder with the coated substrate into the SEM chamber. Adjust the SEM settings such as beam voltage, beam current, and working distance for optimal imaging conditions.

Perform an initial low-magnification scan of the sample surface to locate regions of interest and assess overall sample quality.

Select specific areas of interest on the sample surface for high-magnification imaging. Capture SEM images at various magnifications to observe the morphology, topography, and microstructure on the surface.

Analysis: Conduct qualitative and quantitative analysis of the SEM images to characterize the morphology and structure of the cube. This may include, but is not limited to, the statistical analysis of the lateral size of grains, a discussion on the dimensions and depth of focus of the sample, observation of brightness in the structures, and any relevant assumptions about the structural texture and surface features.

2. FTIR Spectroscopy Analysis:

Set up the FTIR spectrometer according to the manufacturer's instructions and calibrate it using standard procedures.

Place a small amount of sample onto the FTIR sample holder, ensuring a uniform and thin layer.

Record the FTIR spectra of the sample within the appropriate wavelength range, typically in the infrared region (4000-400 cm-1).

Analysis: Analyse the obtained FTIR spectra for characteristic absorption peaks corresponding to functional groups present in the sample. Compare the spectra of the synthesized sample with the literature. Identify similarities or differences in absorption peaks to determine the the unknown material.

3. Profilometer Analysis:

Use the profilometer to scan the sample's surface features and generate a topographical profile of the surface texture. This data will be used to analyse surface texture, and other key features.

Analysis: Examine the surface profile for any characteristic features such as peaks, valleys, or other irregularities. Plot the profile and conduct qualitative and quantitative analysis.